A SURVIVAL ANALYSIS ON PATTERN CLASSIFIER AND DETECTION TECHNIQUES FOR DEFECTIVE IMAGE ANALYSIS

Main Article Content

Dr. S. SAHAYA TAMIL SELVI

Abstract

Image based defect detection becomes a demanding task in estimating the quality of intermediate and end products in  fabric and granite manufacturing, pipeline installation in heavy industries. A fabric defect detection scheme improves the quality for image defect detection and achieves higher accuracy to detect images. But, the image detection is complex in noisy applications. When the image size is large, it provides the false positive detection. The automated fabric defect classification techniques were used to analyze the ability of classifiers that employed in defect inspection systems with geometrical features. But in defect classification technique, level of accuracy is not satisfactory and real-time constraints needs to be addressed. Fabric defect detection is a significant problem in fabric quality control processing, and need to develop fast, efficient, reliable and real-time defect detection through image analysis techniques. Our research work on filtering, pattern classification and pattern detection aims to identify normal and defective image patterns from trained class patterns of the training image dataset.

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Articles
Author Biography

Dr. S. SAHAYA TAMIL SELVI, St. Joseph's College for Women, Tirupur, Tamilnadu, India

ASSISTANT PROFESSOR AND HEAD

DEPARTMENT OF COMPUTER SCIENCE

ST. JOSEPH'S COLLEGE FOR WOMEN 

TIRUPUR

TAMILNADU

INDIA

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